XRD POWDiX Diffractometer
- COMPACT DESIGN
- THETA/THETA GEOMETRY
- HIGH EFFECTIVE HPC DECTRIS* MYTHEN2R 1D DETECTOR
- FAST MEASUREMENTS
- HIGH SIGNAL/NOISE RATIO
- LONG LIFETIME X-RAY TUBE and DETECTOR
- NO EXTERNAL COOLING
- SAFETY GUARANTEED
- ANALYTICAL SOFTWARE
- THE BEST PRICE-QUALITY RATIO
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SOLUTION WITH OPPORTUNITIES OF ANALYTICAL TOOL AT A LOW COST
POWDIX 600/300 is a desktop powder diffractometer that meets the highest requirements for this class of instruments and even exceeds expectations in some ways.
POWDIX 600/300 equipped with the most advanced DECTRIS* MYTHEN2 R 1D detector what drastically speed up the measurement. Express analysis can be carried out in a few minutes while maintaining the quality of the data. The 100% quantum efficiency of the detector and its feature to accumulate the signal keeping low noise level make it possible to collect the highest quality data. That is why the POWDIX 600/300 can analyze even very small amounts of sample. With the high resolution of the detector and the precise positioning of goniometer the accuracy better than +/- 0.02° (2θ) over the full angular range is achieved.
The software interface with predefined experimental scenarios makes the measurement process clear even for new users, though the experts in XRD can create their own protocol. The software for analysis is based on the advanced analytical methods to make the quantitative and qualitative analysis of samples more precise.
Both the detector and the X-ray source have a long lifetime, what significantly reduces the maintenance costs and saves the budget.
POWDIX 600/300 TECHNICAL SPECIFICATIONS:
X-ray generation: |
600 Watts / 300 Watts (on request) |
Target: |
Cu (Cr, Fe, Co, Mo – optional) |
Cooling system: |
Internal water cooling: closed-circuit |
Goniometer: |
Theta/Theta θ-θ vertical, radius 150 mm |
Scanning range: |
-6˚± 154˚(2θ) |
Minimal step: |
0.0001˚(θ) |
Positioning accuracy: |
<+/- 0.02˚ (2θ) |
Setting speed of angle: |
0.01-600 ˚/min |
Measurement speed: | 0.0007-100 ˚/min |
Achievable peak width: |
≤0.05˚ |
Personal computer: | PC with OS Windows 7/8/10 |
SOFTWARE PACKAGE
POWDIXCon for system control and data acquisition |
- Interface optimized for advanced and non-experienced users - Measurement by steps or continuous scan - Predefined measurement scenarios - Data preprocessing - Measurement report |
ALMAZ for advanced data analysis |
- Data preprocessing (virtual monochromator, Lorentz-polarization factor correction, absorption correction, smoothing, background line definition) - Peaks search - Qualitative phase analysis - Quantitative analysis with RIR and internal standard calibration methods - Refinement of lattice parameters by whole pattern-fitting method (Rietveld, Pawley, Le Bail) - Analysis report |
Databases |
- COD (open- access collection) - PDF-2 (optional) |
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ACCESSORIES:
Optics | Incident beam mask, Soller slits, divergence slit, direct beam absorber, set of alignment slits | |
Sample holders |
Standard holders (deep and shallow cavities, perforated), standard reference material holder, glass holders, rotating sample holder |
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K-beta removing |
Ni 0.02 mm filter for diffracted beam |
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Standard Reference material |
Corundum |
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Optional accessories |
Anti-scattering slit Zero diffraction plate Sample changer on 6 pcs. Knife edge - collimator Heating chamber |
FEATURES:
Speak to our sales team or submit your question and we’ll get back to you as soon as possible.
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